DEVELOPMENT OF PRODUCTS ACCELERATED TESTING

Abstract

This one-day course will provide the foundation for designing a successful accelerated testing (AT) program so as to achieve high quality and reliability products and future designs.

Seminar participants will learn:

• why current technique and equipment for AT give no more than 20-30 % of possible benefits;
• why the simulation of real life influences is usually not accurate for a high level of correlation between AT results and field results;
• how one can obtain maximum correlation;
• how engineers and managers can find and eliminate causes for degradation and failures of product quickly and at lower costs;
• how one can minimize the complaints and warranty costs if will use successful accelerated testing and complex analysis of factors that influence product quality during manufacture.

Basic Content

• Introduction to successful accelerated testing (SAT).
• The strategy for creating SAT.
• Accurate physical simulation of real life input influences on the product.
• Technology of step-by-step SAT.
• Conditions for accelerated multiple environmental testing.
• Accurate accelerated corrosion testing.
• Accurate accelerated vibration testing.
• Accurate accelerated reliability testing (ART).
• Accurate prediction of reliability after ART.
• The basic concepts of quality improvement during manufacture.

The seminar is applicable to: mechanical, electro-mechanical, electronic, hydraulic and other devices used in Automotive, Railroad, Aerospace, Marine, etc. It will be useful for service area also.

Bio

Dr. Lev M. Klyatis:

Head of Reliability Department of Eccol, Inc. Prior to this he has been the test and reliability engineer, manager and principal engineer, research leader, chairman of the State Enterprise TESTMASH as well as full professor at the Moscow Technical University, and a United Nations European Economical Commission Expert. He is an expert in the development and use of accelerated testing, especially accelerated reliability testing. He is an Expert of US Technical Advisory Group (TAG) for the International Electrotechnical Commission (IEC), Technical Committee TC 56 (Dependability), updating and development international standards in reliability and maintainability. Received in 2003 ASQ RD Allen Chop Award in Reliability. He has 3 doctors degree: West European high level academic degree (Habilitated Dr.-Ing.), East European high level academic degree (Dr. of Technical Sciences), and Ph.D.

Dr. Klyatis is a frequent speaker at the national & international congresses, symposiums, workshops, including 1997-2000, and 2002 Annual Reliability and Maintainability Symposium (RAMS); 1996, 1997, 2001, and 2002 ASQ Quality Congresses; 1999, 2000, 2001, and 2004 SAE World Congresses. Has more than 200 publications and 30 patents, member of ASQ Quality Press Board of Reviewers. ASQ seminar "Accelerated Testing of Products" instructor. Member of ASQ Metropolitan Section Executive Committee. Listed in Who's Who in America and Who's Who in the World.